CCL Industries. has filed a patent for an inline testing system for RFID inlays. The system includes a test interface with antennas, RFID reader, and circuit for testing and marking non-responsive inlays. The innovative system aims to improve efficiency in RFID testing processes. GlobalData’s report on CCL Industries gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on CCL Industries, Pressure Sensitive Adhesive Tape was a key innovation area identified from patents. CCL Industries's grant share as of January 2024 was 55%. Grant share is based on the ratio of number of grants to total number of patents.
Rfid inlay testing system without moving parts
A recently filed patent (Publication Number: US20230394270A1) describes a test system designed to efficiently assess the functionality of radio frequency identification (RFID) inlays. The system includes a test interface with an array of antennas and an RFID reader to interrogate the RFID inlays. The testing sequence involves a primary scan of all inlays, followed by a secondary scan to identify any non-responsive inlays. The system categorizes subsets of inlays for interrogation, ensuring no identical combinations of antennas are used across configurations. In case of non-responsiveness, the system marks the defective inlays for further action.
Moreover, the patent outlines a method for testing RFID inlays using the described system. The method involves moving the inlays into the test interface, conducting a query of all inlays without associating responses with specific antennas, and performing a secondary scan if not all inlays respond. The secondary scan includes interrogating subsets of inlays and recording failures for non-responsive inlays. The method also includes determining defective inlays based on a failure threshold and marking them accordingly. By utilizing a two-dimensional array of antennas and a systematic testing approach, the system and method aim to streamline the identification of defective RFID inlays for efficient quality control processes.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
